An addition to the methods of test determination for fault detection in combinational circuits
AbstractWe propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.
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How to Cite
Cvetković, L. (2004). An addition to the methods of test determination for fault detection in combinational circuits. Acta Cybernetica, 16(4), 545-566. Retrieved from https://cyber.bibl.u-szeged.hu/index.php/actcybern/article/view/3641